AEC STANDARDS | ||
AEC-Q100-Rev-G | Stress Qualification For Integrated Circuits (with test methods) | respectively |
AEC-Q101-Rev-C | Stress Test Qualification For Discrete Semiconductors | June 29, 2005 |
AEC-Q200-Rev-C | Stress Test Qualification For Passive Components | June 17, 2005 |
자동차용 반도체 신뢰성 시험 규격인 `AEC-Q100'은 자동차 전자부품
협회(Automotive Electronic Council)에서 자동차에 공급되는 전자부품에 대한 신뢰성
평가 절차를 규정한 문서로 전 세계에서 통용된다. 이 규격을 통과한 전자 부품은 가혹한 자동차 사용
환경에서 사용하기에 적합한 신뢰성과 높은 품질을 갖춘 부품으로 인정된다.
AEC-Q100 은 반도체가 150도의 고온에서 42일(1008시간) 이상 정상 작동하는지 여부를 측정하는 테스트도 있다고 한다.
Note: The AEC Technical
Committee is currently revising all referenced AEC test methods. Once this
activity has been completed, the revised test methods and an updated complete
"AEC - Q100 Rev - G" document (base document + AEC test methods) will
be posted here to the AEC website. Please check back periodically for any
updated documents.
AEC - Q100 Rev - G base: Stress Qualification
For Integrated Circuits (base document only with no test methods)
AEC - Q100-001 - Rev-C:
Wire Bond Shear Test
AEC - Q100-002 - Rev-D:
Human Body Model (HBM) Electrostatic Discharge Test
AEC - Q100-003 - Rev-E:
Machine Model (MM) Electrostatic Discharge Test
AEC - Q100-004 - Rev-C:
IC Latch-Up Test
AEC - Q100-005 - Rev-C:
Non-Volatile Memory Program/Erase Endurance, Data Retention, and Operational
Life Test
AEC - Q100-006 - Rev-D:
Electro-Thermally Induced Parasitic Gate Leakage Test (GL)
AEC - Q100-007 - Rev-B:
Fault Simulation and Test Grading
AEC - Q100-008 - Rev-A:
Early Life Failure Rate (ELFR)
AEC - Q100-009 - Rev-B:
Electrical Distribution Assessment
AEC - Q100-010 - Rev-A:
Solder Ball Shear Test
AEC - Q100-011 - Rev-B:
Charged Device Model (CDM) Electrostatic Discharge Test
AEC - Q100-012 - Rev-:
Short Circuit Reliability Characterization of Smart Power Devices for 12V
Systems
AEC - Q101 Rev - C1:
Stress Test Qualification For Discrete Semiconductors (complete document with
test methods)
AEC - Q101 Rev - C base:
Stress Test Qualification For Discrete Semiconductors (base document only with
no test methods)
AEC - Q101-001 - Rev-A:
Human Body Model (HBM) Electrostatic Discharge Test
AEC - Q101-002 - Rev-A:
Machine Model (MM) Electrostatic Discharge Test
AEC - Q101-003 - Rev-A:
Wire Bond Shear Test
AEC - Q101-004 - Rev-:
Miscellaneous Test Methods
AEC - Q101-005 - Rev-:
Charged Device Model (CDM) Electrostatic Discharge Test
AEC - Q101-006 - Rev-:
Short Circuit Reliability Characterization of Smart Power Devices for 12V
Systems
AEC - Q200 Rev - D:
Stress Test Qualification For Passive Components (complete document with test
methods)
AEC - Q200 Rev - D base:
Stress Test Qualification For Passive Components (base document only with no
test methods)
AEC - Q200-001 - Rev-B:
Flame Retardance Test
AEC - Q200-002 - Rev-B:
Human Body Model (HBM) Electrostatic Discharge Test
AEC - Q200-003 - Rev-B:
Beam Load (Break Strength) Test
AEC - Q200-004 - Rev-A:
Measurement Procedures for Resettable Fuses
AEC - Q200-005 - Rev-A:
Board Flex / Terminal Bond Strength Test
AEC - Q200-006 - Rev-A:
Terminal Strength (SMD) / Shear Stress Test
AEC - Q200-007 - Rev-A:
Voltage Surge Test
자동차 전자부품 협회(Automotive Electronic Council) : http://www.aecouncil.com/
번호 | 제목 | 닉네임 | 조회 | 등록일 |
---|---|---|---|---|
35 | Ringing 현상 | dwkim |
32940 | 2011-11-22 |
34 | MediaLB | dwkim |
2011-11-16 | |
33 | CAN (Controller Area Network) | dwkim |
15297 | 2011-11-16 |
32 | MOST | dwkim |
2011-11-16 | |
31 | 히스테리시스 | dwkim |
16792 | 2011-11-12 |
30 | 오픈 드레인, 오픈 콜렉터 | dwkim |
14136 | 2011-11-12 |
29 | SPDIF | dwkim |
12058 | 2011-11-11 |
28 | USB (Universal Serial Bus) | dwkim |
14379 | 2011-11-11 |
27 | 분산 스펙트럼 클럭(SSC : Spread Spectrum Clock) | dwkim |
2011-11-09 | |
26 | 글리치(Glitch) | dwkim |
18733 | 2011-11-09 |
25 | 바운스(Bounce) 현상 or 채터링(Chattering) | dwkim |
22635 | 2011-11-09 |
24 | 부성저항 | dwkim |
14083 | 2011-11-09 |
23 | PROGRESSIVE, INTERLACE 방식 | dwkim |
2011-11-09 | |
22 | 돌입전류, Thermistor | dwkim |
18663 | 2011-11-09 |
21 | 기생 캐패시턴스 | dwkim |
18338 | 2011-11-09 |
20 | Surge Protector ? | dwkim |
19711 | 2011-11-09 |
AEC-Q100, AEC-Q200 [1] | dwkim |
54162 | 2011-11-09 | |
18 | I2S | dwkim |
14792 | 2011-09-21 |
17 | I2C | dwkim |
11700 | 2011-09-14 |
16 | SD 카드의 속도 | dwkim |
11695 | 2011-09-08 |